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Materials Characterization


      Zeiss Neon 40 Field Emission SEM with Focused Ion Beam                                       

0.9 nm resolution at 20 kV, nanofabrication using FIB, energy dispersive X-ray, electron backscatter diffraction, gas injection for metal deposition, serial sectioning and 3D image reconstruction

       THz Spectroscopy/Imaging                                                                                                    

The capabilities include (a) Fourier transform infrared spectrometer (FTIR) for spectral characteristic of materials from 1.5 to 20 THz and (b) microbolometer focal plane array camera and THz quantum cascade lasers (QCLs) for real time imaging in 1-5 THz spectral band.  These facilities are being used for developing high THz absorbing materials and video rate imaging of concealed objects.


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