Some of the techniques to characterize solid materials available at the Naval Postgraduate School include: X-ray diffraction (XRD), Physisorption surface area analysis (BET), Thermogravimetry (TGA)-Differential Scanning Calorimetry (DSC), Mass Spectroscopy (MS), Energy Dispersive Spectroscopy (EDS), Electron Microscopy (SEM and TEM) and Energy Electron Loss Spectroscopy (EELS). A solid sample could be analyzed to determine features such as crystal structure, surface area, size and shape of pores, thermal stability, phase distribution, and bonding environment among others.

The nanomechanical testing facility is capable of providing nanoscale measurements of mechanical properties including hardness, elastic modulus, scratch resistance and coefficient of friction, as well as performing topographic imaging and dynamical mechanical analysis for measurement of frequency-dependent properties of viscoelastic materials.

The cleanroom at NPS is a versatile facility featuring many MEMS and carbon nanotube processes. The processes include deposition of thin metal films, silicon-based films via PECVD and carbon nanotubes, plasma etching of Si-based semiconductor and dielectric films, wet etching of metals, semiconductor or dielectric films, film thicknesses and stress characterization. We also have photolithographic capabilities with a contact aligner.